Automated Stitching of Noisy Scanning Electron Microscopy Images for Integrated Circuit Reverse Engineering
- Burian, Daniel
- Pucher, Michael
- Kudera, Christian
- Merzdovnik, Georg
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Shortfacts
Category |
Paper in Conference Proceedings or in Workshop Proceedings (Paper) |
Event Title |
2022 IEEE International Conference on Physical Assurance and Inspection of Electronics (PAINE) |
Divisions |
Security and Privacy |
Subjects |
Computersicherheit Angewandte Informatik |
Event Location |
Huntsville, AL, USA |
Event Type |
Conference |
Event Dates |
25-27 Oct 2022 |
ISSN/ISBN |
979-8-3503-9909-7 |
Date |
19 January 2023 |
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