Attackers Can Do Better: Over- and Understated Factors of Model Stealing Attacks

Attackers Can Do Better: Over- and Understated Factors of Model Stealing Attacks

Content
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Authors
  • Oliynyk, Daryna
  • Mayer, Rudolf
  • Rauber, Andreas
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Shortfacts
Category
 Paper in Conference Proceedings or in Workshop Proceedings (Paper)
Event Title
 IEEE Conference on Secure and Trustworthy Machine Learning (SaTML)
Divisions
 Security and Privacy
Subjects
 Computersicherheit
Angewandte Informatik
Event Location
 University of Copenhagen, Denmark
Event Type
 Conference
Event Dates
 9-11 April 2025
Date
 1 April 2025
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